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ChemInform Abstract: Mg Content Dependence of the Electromigration Resistance of Fine- Grained Al-Si Alloys.

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ChemInform Abstract: Present Achievement

✍ S. G. FRIES; I. HURTADO; T. JANTZEN; P. J. SPENCER; K. C. HARI KUMAR; F. ALDINGE 📂 Article 📅 2010 🏛 John Wiley and Sons ⚖ 27 KB 👁 3 views