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ChemInform Abstract: Magnetic Resonance Techniques for Excited State Spectroscopy of Defects in Silicon

✍ Scribed by W. M. CHEN; B. MONEMAR; A. M. FRENS; M. T. BENNEBROEK; J. SCHMIDT

Book ID
112023556
Publisher
John Wiley and Sons
Year
2010
Weight
25 KB
Volume
26
Category
Article
ISSN
0931-7597

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