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ChemInform Abstract: Impurities in Solar-Grade Silicon

✍ Scribed by D. Macdonald; J. Tan

Publisher: John Wiley and Sons
Year: 2009
Weight: 15 KB
Volume: 40
Category: Article
ISSN: 0931-7597
DOI: 10.1002/chin.200947219

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## Dedicated to Professor Dr. Wolfgang Schro È ter on the occasion of his 65th anniversary The effective lifetime of charge carriers t eff in multicrystalline silicon (mc-Si) Baysix 1 wafers (in our case: Bridgman-type) cut from areas close above the ingot bottom is reduced (t eff < 1 ms). However