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ChemInform Abstract: Formation of Al2O3—Ta2O5 Double-Oxide Thin Films by Low-Pressure MOCVD and Evaluation of Their Corrosion Resistances in Acid and Alkali Solutions.

✍ Scribed by Nobuyoshi Hara; Shintaro Nagata; Noboru Akao; Katsuhisa Sugimoto


Publisher
John Wiley and Sons
Year
2010
Weight
34 KB
Volume
30
Category
Article
ISSN
0931-7597

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