✦ LIBER ✦
ChemInform Abstract: Experimental Methods for Investigating the Defect Properties of SiO2 in Metal Oxide Semiconductor Transistors
✍ Scribed by W. WEBER; R. THEWES
- Publisher
- John Wiley and Sons
- Year
- 2010
- Weight
- 27 KB
- Volume
- 29
- Category
- Article
- ISSN
- 0931-7597
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