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ChemInform Abstract: EPR Identification of Intrinsic Defects in SiC

✍ Scribed by J. Isoya; T. Umeda; N. Mizuochi; N. T. Son; E. Janzen; T. Ohshima

Publisher
John Wiley and Sons
Year
2011
Weight
20 KB
Volume
42
Category
Article
ISSN
0931-7597

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