✦ LIBER ✦
ChemInform Abstract: Doping Profile Analysis in Si by Electrochemical Capacitance-Voltage ( ECV) Measurements.
✍ Scribed by E. PEINER; A. SCHLACHETZKI; D. KRUEGER
- Book ID
- 112022513
- Publisher
- John Wiley and Sons
- Year
- 2010
- Weight
- 29 KB
- Volume
- 26
- Category
- Article
- ISSN
- 0931-7597
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