Surface Properties of Electronic Materia
โ D.A. KING and D.P. WOODRUFF (Eds.)
๐ Library
๐
1988
๐ Academic Press, Elsevier
โฆ LIBER โฆ
๐
Chemical, Structural and Electronic Analysis of Heterogeneous Surfaces on Nanometer Scale
โ Scribed by PH. Avouris, I.-W. Lyo, Y. Hasegawa (auth.), Renzo Rosei (eds.)
- Publisher
- Springer Netherlands
- Year
- 1997
- Tongue
- English
- Leaves
- 137
- Series
- NATO ASI Series 333
- Edition
- 1
- Category
- Library
โฌ Acquire This Volume
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โฆ Synopsis
An assessment of the recent achievements and relative strengths of two developing techniques for characterising surfaces at the nanometer scale: (i) local probe methods, including scanning tunnelling microscopy and its derivatives; and (ii) nanoscale photoemission and absorption spectroscopy for chemical analysis.
The keynote lectures were delivered by some of the world's best scientists in the field and some of the topics covered include: (1) The possible application of STM in atomically resolved chemical analysis. (2) The principles of scanning force/friction and scanning near-field optical microscopes. (3) The scanning photoemission electron microscopes built at ELETTRA and SRRC, with a description of synchrotron radiation microscopy. (4) Recent progress in the development of spatially-resolved photoelectron microscopy, especially the use of zone plate photon optics. (5) The present status of non-scanning photoemission microscopy with slow electrons. (6) the BESSY 2 project for a non-scanning photoelectron microscope with electron optics. (7) Spatially-resolved in situ reaction studies of chemical waves and oscillatory phenomena with the UV photoemission microscope.
โฆ Table of Contents
Front Matter....Pages i-x
Surface State Electrons: Transport Through Dangling Bonds on Silicon, and Scattering and Confinement on Metals....Pages 1-23
SFFM and SNOM of Heterogeneous Materials....Pages 25-41
Synchrotron Radiation Spectromicroscopy: Opportunities, Limitations and Data Taking Strategies....Pages 43-52
Scanning Spectro-Microscopy with 250 to 800 eV X-Rays....Pages 53-74
Recent Advances in LEEM/PEEM for Structural and Chemical Analysis....Pages 75-91
Some Spectromicroscopy Developments at Bessy....Pages 93-102
Shedding Light on Surface Reactions....Pages 103-129
Back Matter....Pages 131-132
โฆ Subjects
Surfaces and Interfaces, Thin Films;Physical Chemistry;Characterization and Evaluation of Materials;Measurement Science and Instrumentation
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