Chemical driving force for diffusion-induced recrystallization or diffusion-induced grain boundary migration in a binary system consisting of nonvolatile elements

Quantitative analysis of observations on

Quantitative analysis of observations on diffusion induced grain boundary migration for random boundaries in the Cu(Zn) system using a driving force model

✍ Y. Yamamoto; M. Kajihara 📂 Article 📅 1999 🏛 Elsevier Science 🌐 English ⚖ 224 KB

AbstractÐDiusion induced grain boundary migration (DIGM) in the Cu(Zn) system was experimentally studied by Li and Hillert using polycrystalline Cu specimens zinci®ed with binary Cu±Zn alloys containing 3.9±30.5 wt% of Zn at temperatures between 573 and 773 K. Their experimental results have been qu