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Chemical and structural analysis by ellipsometry and x-ray reflectometry of thin sulfide layers grown on InP

✍ Scribed by M. Gendry; J. Durand; M. Erman; J.B. Theeten; L. Nevot; B. Pardo

Publisher: Elsevier Science
Year: 1990
Tongue: English
Weight: 746 KB
Volume: 44
Category: Article
ISSN: 0169-4332
DOI: 10.1016/0169-4332(90)90088-h

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