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Chemical and microstructural study in radio frequency sputtered CdTe oxide films prepared at different N2O pressures. Oxygen incorporation and film resputtering

✍ Scribed by F. Caballero-Briones; A.I. Oliva; P. Bartolo-Pérez; A. Zapata-Navarro; J.L. Peña


Book ID
108290061
Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
512 KB
Volume
516
Category
Article
ISSN
0040-6090

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