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Chemical and Crystallographic Characterization of the Tip Apex in Scanning Probe Microscopy

✍ Scribed by Hofmann, Thomas; Pielmeier, Florian; Giessibl, Franz J.


Book ID
121505889
Publisher
The American Physical Society
Year
2014
Tongue
English
Weight
577 KB
Volume
112
Category
Article
ISSN
0031-9007

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## Abstract Scanning probe microscopy (SPM) is a widely used experimental technique for characterizing and fabricating nanostructures on surfaces. In particular, due to its ability to spatially map variations in materials properties with nanometer spatial resolution, SPM is particularly well suited