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Chemical Analysis of Thin Films by X-Ray Emission Spectrography

โœ Scribed by Rhodin, T. N.


Book ID
127077191
Publisher
American Chemical Society
Year
1955
Tongue
English
Weight
635 KB
Volume
27
Category
Article
ISSN
0003-2700

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Thin Film Analysis by X-Ray Scattering (
โœ Birkholz, Mario ๐Ÿ“‚ Article ๐Ÿ“… 2006 ๐Ÿ› Wiley-VCH Verlag GmbH & Co. KGaA ๐ŸŒ German โš– 526 KB

With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of t