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Charged particle detection performances of CMOS pixel sensors produced in a 0.18μm process with a high resistivity epitaxial layer

✍ Scribed by Senyukov, S.; Baudot, J.; Besson, A.; Claus, G.; Cousin, L.; Dorokhov, A.; Dulinski, W.; Goffe, M.; Hu-Guo, C.; Winter, M.


Book ID
123180213
Publisher
Elsevier Science
Year
2013
Tongue
English
Weight
785 KB
Volume
730
Category
Article
ISSN
0168-9002

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