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Charged defects on Ge(111)-c(2×8): characterization using STM

✍ Scribed by Geunseop Lee; H. Mai; Ilya Chizhov; R.F. Willis


Book ID
117215017
Publisher
Elsevier Science
Year
2000
Tongue
English
Weight
534 KB
Volume
463
Category
Article
ISSN
0039-6028

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