✦ LIBER ✦
Charged Defects in Wet SiO2/Si Structure Modified by RF Oxygen Plasma Treatment
✍ Scribed by Alexandrova, S. ;Szekeres, A.
- Publisher
- John Wiley and Sons
- Year
- 1999
- Tongue
- English
- Weight
- 151 KB
- Volume
- 171
- Category
- Article
- ISSN
- 0031-8965
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