Charge trapping properties and retention time in amorphous SiGe/SiO 2 nanolayers

✍ Scribed by Vieira, E M F; Diaz, R; Grisolia, J; Parisini, A; Martín-Sánchez, J; Levichev, S; Rolo, A G; Chahboun, A; Gomes, M J M

• Book ID: 120246755
• Publisher: Institute of Physics
• Year: 2013
• Tongue: English
• Weight: 710 KB
• Volume: 46
• Category: Article
• ISSN: 0022-3727
• DOI: 10.1088/0022-3727/46/9/095306