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Charge transfer and rest-atom imaging in dimer-adatom-stacking-fault structure evolution observed by scanning tunnelling microscopy on the Si(111) surface

✍ Scribed by Z. Zhang; M.A. Kulakov; B. Bullemer


Book ID
117217009
Publisher
Elsevier Science
Year
1997
Tongue
English
Weight
712 KB
Volume
375
Category
Article
ISSN
0039-6028

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