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Charge storage in silicon-implanted silicondioxide layers examined by scanning probe microscopy

✍ Scribed by Reinhard Beyer; Elke Beyreuther; Johannes von Borany; Jörg Weber


Book ID
108289341
Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
517 KB
Volume
513
Category
Article
ISSN
0040-6090

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