✦ LIBER ✦
Charge storage in MNOS transistors at electric fields near gate insulator breakdown : J. R. Cricchi and W. D. Reed, Jr.Proc. IEEE Reliab. Physics Symp., Las Vegas, U.S.A., 31 March–2 April (1971)
- Book ID
- 103270605
- Publisher
- Elsevier Science
- Year
- 1971
- Tongue
- English
- Weight
- 111 KB
- Volume
- 10
- Category
- Article
- ISSN
- 0026-2714
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