✦ LIBER ✦
Charge pumping spectroscopy: HfSiON defect study after substrate hot electron injection
✍ Scribed by M. Toledano-Luque; L. Pantisano; R. Degraeve; M.B. Zahid; I. Ferain; E. San Andrés; G. Groeseneken; S. De Gendt
- Book ID
- 104051742
- Publisher
- Elsevier Science
- Year
- 2007
- Tongue
- English
- Weight
- 699 KB
- Volume
- 84
- Category
- Article
- ISSN
- 0167-9317
No coin nor oath required. For personal study only.