## Abstract A scanning Kelvin probe microscopy (SKPM) study of the surface potential of vacuum sublimed pentacene transistors under bias stress and its correlation with the film morphology is presented. While for thicker films there are some trapping centers inhomogeneously distributed over the fil
β¦ LIBER β¦
Charge pumping in thin film transistors
β Scribed by N.S. Saks; S. Batra; M. Manning
- Publisher
- Elsevier Science
- Year
- 1995
- Tongue
- English
- Weight
- 365 KB
- Volume
- 28
- Category
- Article
- ISSN
- 0167-9317
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