✦ LIBER ✦
Charge enhancement effect in NMOS bulk transistors induced by heavy ion Irradiation-comparison with SOI
✍ Scribed by Ferlet-Cavrois, V.; Vizkelethy, G.; Paillet, P.; Torres, A.; Schwank, J.R.; Shaneyfelt, M.R.; Baggio, J.; de Pontcharra, Jd.P.; Tosti, L.
- Book ID
- 120883704
- Publisher
- IEEE
- Year
- 2004
- Tongue
- English
- Weight
- 335 KB
- Volume
- 51
- Category
- Article
- ISSN
- 0018-9499
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