Charge emission from interface states at silicon grain boundaries by thermal emission and thermionic-field emission—Part II: Experiment

✍ Scribed by De Groot, A.W.; Card, H.C.

• Book ID: 114594871
• Publisher: IEEE
• Year: 1984
• Tongue: English
• Weight: 677 KB
• Volume: 31
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/t-ed.1984.21718