✦ LIBER ✦
Charge-Based Capacitance Measurement Technique for Nanoscale Devices: Accuracy Assessment Based on TCAD Simulations
✍ Scribed by Hui Zhao; Rustagi, S.C.; Ma, F.-J.; Samudra, G.S.; Singh, N.; Lo, G.Q.; Dim-Lee Kwong
- Book ID
- 114619613
- Publisher
- IEEE
- Year
- 2009
- Tongue
- English
- Weight
- 415 KB
- Volume
- 56
- Category
- Article
- ISSN
- 0018-9383
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