✦ LIBER ✦
Charge accumulation in the buried oxide of SOI structures with the bonded Si/SiO 2 interface under γ-irradiation: effect of preliminary ion implantation
✍ Scribed by Naumova, O V; Fomin, B I; Ilnitsky, M A; Popov, V P
- Book ID
- 118742503
- Publisher
- Institute of Physics
- Year
- 2012
- Tongue
- English
- Weight
- 675 KB
- Volume
- 27
- Category
- Article
- ISSN
- 0268-1242
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