Characterizing the Electric Field Coupling from IC Heatsink Structures to External Cables Using TEM Cell Measurements

✍ Scribed by Deng Shaowei; Hubing, T.; Beetner, D.G.

• Book ID: 114624622
• Publisher: IEEE
• Year: 2007
• Tongue: English
• Weight: 834 KB
• Volume: 49
• Category: Article
• ISSN: 0018-9375
• DOI: 10.1109/temc.2007.908825