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Characterizing soil deformation by visual inspection of the profile

✍ Scribed by Randall K. Wood; Larry G. Wells


Publisher
Elsevier Science
Year
1985
Tongue
English
Weight
155 KB
Volume
22
Category
Article
ISSN
0022-4898

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## Abstract An optical nondestructive strain measurement technique was performed to analyze the mechanical deformation induced by an electrical field within the insulating materials. Poly(ethylene naphthalene 2,6‐dicarboxylate) (PEN) films were then subjected to constant electrical fields right up