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Characterization of ZnSe(Te) scintillators by frequency domain luminescence lifetime measurements

✍ Scribed by J. Mickevičius; G Tamulaitis; P. Vitta; A. Žukauskas; N. Starzhinskiy; V. Ryzhikov

Publisher: Elsevier Science
Year: 2009
Tongue: English
Weight: 276 KB
Volume: 610
Category: Article
ISSN: 0168-9002
DOI: 10.1016/j.nima.2009.05.093

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✦ Synopsis

Dynamics of photoluminescence (PL) decay in Te-doped ZnSe scintillator crystal is studied using frequency domain luminescence lifetime measurement technique, which enables simultaneous characterization of components in multicomponent PL decay in a wide time window ranging from millisecond to nanosecond domain. Evolution of decay times and relative contributions of the decay components corresponding to different PL decay mechanisms was revealed as a function of temperature.

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