✦ LIBER ✦
Characterization of vacancy-related defects introduced into silicon during heat treatment by deep-level transient spectroscopy and gamma-ray diffraction techniques
✍ Scribed by N. A. Sobolev,E. I. Shek,A. I. Kurbakov,E. E. Rubinova…
- Book ID
- 118290325
- Publisher
- Springer
- Year
- 1996
- Tongue
- English
- Weight
- 386 KB
- Volume
- 62
- Category
- Article
- ISSN
- 1432-0630
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