✦ LIBER ✦
Characterization of V-defects in InGaN Single Quantum Well Films at the Nanometer Level by High-Spatial-Resolution Cathodoluminescence Spectroscopy
✍ Scribed by Yoshikawa, M.; Murakami, M.; Ishida, H.; Harima, H.
- Book ID
- 115365962
- Publisher
- Society for Applied Spectroscopy
- Year
- 2008
- Tongue
- English
- Weight
- 756 KB
- Volume
- 62
- Category
- Article
- ISSN
- 0003-7028
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