Characterization of ultrathin metal–oxide–semiconductor structures using coupled current and capacitance–voltage models based on quantum calculation

✍ Scribed by Simonetti, O.; Maurel, T.; Jourdain, M.

• Book ID: 121412834
• Publisher: American Institute of Physics
• Year: 2002
• Tongue: English
• Weight: 445 KB
• Volume: 92
• Category: Article
• ISSN: 0021-8979
• DOI: 10.1063/1.1506000