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Characterization of Ultrathin Films of γ-Al 2 O 3 and the Chemistry of 1,3-Butadiene on NiAl(001) and γ-Al 2 O 3

✍ Scribed by Ivey, Michelle M.; Layman, Kathryn A.; Avoyan, Armen; Allen, Heather C.; Hemminger, John C.

Book ID
126184148
Publisher
American Chemical Society
Year
2003
Tongue
English
Weight
334 KB
Volume
107
Category
Article
ISSN
0022-3654

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Laser Raman spectroscopy (LRS), X-ray di4raction (XRD), X-ray photoelectron spectroscopy (XPS), ultraviolet and di4use re6ectance spectroscopy (UV-DRS), and temperature-programmed reduction (TPR) are used to characterize a series of TiO 2 / -Al 2 O 3 , NiO/ -Al 2 O 3 , and NiO/TiO 2 / -Al 2 O 3 samp