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Characterization of UF5 ultrafine particles using TEM, XPS, and XRD

โœ Scribed by J. Onoe; N. Uehara; Y. Iimura; T. Oyama; O. Suto; Y. Shimazaki; K. Takeuchi


Book ID
103220424
Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
797 KB
Volume
207
Category
Article
ISSN
0022-3115

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