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Characterization of titanium hydride film after long-term air interaction: SEM, ARXPS and AES depth profile studies

✍ Scribed by Lisowski, W.; van den Berg, A. H. J.; Smithers, M.


Publisher
John Wiley and Sons
Year
1998
Tongue
English
Weight
490 KB
Volume
26
Category
Article
ISSN
0142-2421

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