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Characterization of TiOx films and their application as antireflection coatings for silicon solar cells

✍ Scribed by A. Armigliato; G. Celotti; S. Guerri; P. Ostoja; R. Rosa; G. Martinelli


Publisher
Elsevier Science
Year
1981
Weight
1004 KB
Volume
3
Category
Article
ISSN
0379-6787

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Low temperature pulsed electron depositi
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## Abstract Zinc Sulphide films were grown by pulsed electron deposition (PED) from room temperature to 350 Β°C to investigate the possibility of its application in solar cells, in particular as an alternative buffer layer deposited at low temperature. The films were characterized by X‐ray diffracti