✦ LIBER ✦
Characterization of Threading Dislocations in PVT-Grown AlN Substrates via x-Ray Topography and Ray Tracing Simulation
✍ Scribed by Zhou, Tianyi; Raghothamachar, Balaji; Wu, Fangzhen; Dalmau, Rafael; Moody, Baxter; Craft, Spalding; Schlesser, Raoul; Dudley, Michael; Sitar, Zlatko
- Book ID
- 121567853
- Publisher
- Springer US
- Year
- 2014
- Tongue
- English
- Weight
- 542 KB
- Volume
- 43
- Category
- Article
- ISSN
- 0361-5235
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