The applicability of models based on fractal geometry to characterize thin-Ðlm surfaces was investigated. The fractal geometry of sputtered chromium nitride and silicon nitride thin-Ðlm surfaces was described using Fourier spectral analysis of proÐles from scanning tunnelling microscopy images and a
✦ LIBER ✦
Characterization of thin-film surfaces by fractal geometry
✍ Scribed by W. Zahn; A. Zösch
- Publisher
- Springer
- Year
- 1997
- Tongue
- English
- Weight
- 60 KB
- Volume
- 358
- Category
- Article
- ISSN
- 1618-2650
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