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Characterization of thin-film electroluminescent structures by SIMS and other analytical techniques

✍ Scribed by H. Antson; M. Grasserbauer; M. Hamilo; L. Hiltunen; T. Koskinen; M. Leskelä; L. Niinistö; G. Stingeder; M. Tammenmaa

Book ID
112358119
Publisher
Springer
Year
1985
Tongue
English
Weight
889 KB
Volume
322
Category
Article
ISSN
1618-2650

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