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Characterization of thermally oxidized Ta/GaAs Schottky barrier structures prepared by low energy RF sputtering with X-ray photoemission, TEM and optical transmittance measurements

✍ Scribed by P. Gladkov; K. Varblianska; Ts. Marinova; V. Krastev; J. Stoemenos


Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
563 KB
Volume
59
Category
Article
ISSN
0169-4332

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