Characterization of the tunneling insulator in MIM cathodes by low-stress I-V measurement

✍ Scribed by Suzuki, M.; Sagawa, M.; Kusunoki, T.; Tsuji, K.

• Book ID: 114617060
• Publisher: IEEE
• Year: 2003
• Tongue: English
• Weight: 360 KB
• Volume: 50
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2003.812483