## Abstract Time of flight secondary ion mass spectrometry (ToF‐SIMS) is an ideal technique for the analysis of adsorbed protein films because of its surface sensitivity and chemical specificity. In this study, we examined ToF‐SIMS with the multivariate calibration method partial least squares regr
✦ LIBER ✦
Characterization of the Structure of Binary and Ternary Adsorbed Protein Films Using Electron Spectroscopy for Chemical Analysis, Time-of-Flight Secondary Ion Mass Spectrometry, and Radiolabeling †
✍ Scribed by Wagner, M. S.; Horbett, T. A.; Castner, David G.
- Book ID
- 126940559
- Publisher
- American Chemical Society
- Year
- 2003
- Tongue
- English
- Weight
- 169 KB
- Volume
- 19
- Category
- Article
- ISSN
- 0743-7463
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