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Characterization of the silicon-sapphire interface

✍ Scribed by J. Trilhe; J. Borel; J.P. Duchemin

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Crystalline quality improvement in silic

✍ P. A. Alexandrov; K. D. Demakov; S. G. Shemardov; Yu. Yu. Kuznetsov 📂 Article 📅 2010 🏛 Springer 🌐 English ⚖ 104 KB

Characterization of silicon-on-sapphire

✍ El-Mansy, Y.A.; Caughey, D.M. 📂 Article 📅 1977 🏛 IEEE 🌐 English ⚖ 625 KB

Silicon-sapphire interface charge trappi

✍ Neamen, D.; Buchanan, B. 📂 Article 📅 1976 🏛 IEEE 🌐 English ⚖ 745 KB

The non-destructive characterization of

✍ MG Pitt 📂 Article 📅 1985 🏛 Elsevier Science 🌐 English ⚖ 304 KB

An investigation of the silicon—Sapphire

✍ Goodman, A.M. 📂 Article 📅 1975 🏛 IEEE 🌐 English ⚖ 415 KB

Influence of silicon-sapphire interface

✍ J.O. Nylander; U. Magnusson; M. Rosling; P.A. Tove 📂 Article 📅 1988 🏛 Elsevier Science 🌐 English ⚖ 327 KB