✦ LIBER ✦
Characterization of the silicon-on-insulator material formed by high-dose oxygen implantation using spectroscopic ellipsometry: F Ferrieu et al, J appl Phys, 62, 1987, 3458–3461
- Publisher
- Elsevier Science
- Year
- 1989
- Tongue
- English
- Weight
- 148 KB
- Volume
- 39
- Category
- Article
- ISSN
- 0042-207X
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