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Characterization of the self-heating of AlGaN/GaN HEMTs during an electrical stress by using Raman spectroscopy

✍ Scribed by F. Berthet; Y. Guhel; H. Gualous; B. Boudart; J.L. Trolet; M. Piccione; C. Gaquiére


Book ID
113800542
Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
905 KB
Volume
51
Category
Article
ISSN
0026-2714

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