Characterization of the radiation-induced defects in Si detectors by carrier transport and decay transients

✍ Scribed by E. Gaubas; G. Juška; J. Vaitkus; E. Fretwurst

• Book ID: 108223355
• Publisher: Elsevier Science
• Year: 2007
• Tongue: English
• Weight: 647 KB
• Volume: 583
• Category: Article
• ISSN: 0168-9002
• DOI: 10.1016/j.nima.2007.08.197