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Characterization of the poly(para-phenylene vinylene)-chromium interface by attenuated total reflection infrared and X-ray emission spectroscopies

✍ Scribed by T.P. Nguyen; P. Jonnard; F. Vergand; P.F. Staub; J. Thirion; M. Łapkowski; V.H. Tran

Book ID: 116136894
Publisher: Elsevier Science
Year: 1995
Tongue: English
Weight: 636 KB
Volume: 75
Category: Article
ISSN: 0379-6779
DOI: 10.1016/0379-6779(96)80004-x

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