Characterization of the interface adhesion of elastic–plastic thin film/rigid substrate systems using a pressurized blister test numerical model

✍ Scribed by Limei Jiang; Yichun Zhou; Hongxiao Hao; Yanguo Liao; Chunsheng Lu

• Publisher: Elsevier Science
• Year: 2010
• Tongue: English
• Weight: 636 KB
• Volume: 42
• Category: Article
• ISSN: 0167-6636
• DOI: 10.1016/j.mechmat.2010.07.009