✦ LIBER ✦
Characterization of the Diffusion and Rreaction Behaviour of Ti/Pt/Au Layer Contacts on GaAs by Means of Auger Electron Spectroscopy and Ion Sputtering Technique
✍ Scribed by Reif, A. ;Streubel, P. ;Meisel, A. ;Zeissig, D.
- Publisher
- John Wiley and Sons
- Year
- 1990
- Tongue
- English
- Weight
- 526 KB
- Volume
- 122
- Category
- Article
- ISSN
- 0031-8965
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