✦ LIBER ✦
Characterization of surfactant introduction into germanium-rich Si1−x Gex molecular beam epitaxy layer growth on silicon by means of secondary-ion mass spectrometry and Auger electron spectroscopy
✍ Scribed by D. Krüeger; R. Kurps; H.J. Osten; G. Lippert; D. Roeser
- Publisher
- Elsevier Science
- Year
- 1992
- Tongue
- English
- Weight
- 292 KB
- Volume
- 221
- Category
- Article
- ISSN
- 0040-6090
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